Dr. Zagni, Prof. Puglisi, and Prof. Pavan are the UNIMORE co-authors of the review article entitled “Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges” published on the prestigious journal Proceedings of the IEEE on the
New Contributed Chapter – Springer Handbook of Semiconductor Devices
The “Springer Handbook of Semiconductor Devices” has been released online on the editor’s webpage at this link. The book contains the contributed chapter “Negative capacitors and applications” co-authored by Nicolò Zagni. The chapter discusses the tremendous opportunities for CMOS technology