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New Article Published in ‘Proceedings of the IEEE’ Journal

Dr. Zagni, Prof. Puglisi, and Prof. Pavan are the UNIMORE co-authors of the review article entitled “Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges” published on the prestigious journal Proceedings of the IEEE on the

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New Contributed Chapter – Springer Handbook of Semiconductor Devices

The “Springer Handbook of Semiconductor Devices” has been released online on the editor’s webpage at this link. The book contains the contributed chapter “Negative capacitors and applications” co-authored by Nicolò Zagni. The chapter discusses the tremendous opportunities for CMOS technology

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Where We Are

Address
via P. Vivarelli 10 c/o Dipartimento di Ingegneria “Enzo Ferrari”
41125 Modena (MO)

Building MO26 (2nd Floor)

Master’s Students

If you are looking for possible research themes for your Thesis, please take a look at our proposals in the dedicated section here.

News

  • New Article Published in ‘Proceedings of the IEEE’ Journal
  • New Contributed Chapter – Springer Handbook of Semiconductor Devices
  • Sara Vecchi is awarded the “Best Student Paper Award” and the “People’s Choice Award” at the 2022 IEEE International Reliability Physics Symposium (IRPS)

Useful Links

  • IEEE-IEDM
  • IEEE-IRPS
  • ESSDERC-ESSCIRC
  • IEEE IIRW
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